scanning reflection electron microscopy

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• Electron microscope — Diagram of a transmission electron microscope A 197 …   Wikipedia

• Microscopy — is the technical field of using microscopes to view samples and objects that cannot be seen with the unaided eye (objects that are not within the resolution range of the normal eye). There are three well known branches of microscopy, optical,… …   Wikipedia

• Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… …   Wikipedia

• Electron — For other uses, see Electron (disambiguation). Electron Experiments with a Crookes tube first demonstrated the particle nature of electrons. In this illustration, the profile of the cross shaped target is projected against the tube face at right… …   Wikipedia

• Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia

• Électron — Traduction à relire Electron → …   Wikipédia en Français

• Electron energy loss spectroscopy — In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they lose energy and have their… …   Wikipedia

• Confocal microscopy — Diagnostics MeSH D018613 OPS 301 code 3 301 …   Wikipedia

• Dark field microscopy — (dark ground microscopy) describes microscopy methods, in both light and electron microscopy, which exclude the unscattered beam from the image. As a result, the field around the specimen (i.e. where there is no specimen to scatter the beam) is… …   Wikipedia

• Confocal laser scanning microscopy — (CLSM or LSCM) is a technique for obtaining high resolution optical images with depth selectivity.[1] The key feature of confocal microscopy is its ability to acquire in focus images from selected depths, a process known as optical sectioning.… …   Wikipedia

• List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy …   Wikipedia